The results of an experimental study of Raman scattering, photolumines
cence, and light absorption and reflection in porous silicon layers ob
tained by electrochemical etching of single-crystal wafers are present
ed. It is concluded on the basis of an analysis of the experimental da
ta that the centers responsible for radiative and nonradiative recombi
nation in this material are of a multiple character, The experimental
data show that the centers whose maximum of optical excitation lies in
the blue-green region of the spectrum have a uniform distribution, in
contrast with the centers whose region of efficient excitation lies i
n the red region of the spectrum. The radiative recombination efficien
cy of the latter increases in a thin, near-surface layer of a porous-s
ilicon film. (C) 1998 American Institute of Physics.