THE GEOMETRY OF XENON AND KRYPTON ON RU(001) - A LEED-IV INVESTIGATION

Citation
B. Narloch et D. Menzel, THE GEOMETRY OF XENON AND KRYPTON ON RU(001) - A LEED-IV INVESTIGATION, Surface science, 413, 1998, pp. 562-579
Citations number
45
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
413
Year of publication
1998
Pages
562 - 579
Database
ISI
SICI code
0039-6028(1998)413:<562:TGOXAK>2.0.ZU;2-U
Abstract
Detailed LEED IV analyses of the (root 3 x root 3)R30 degrees-Xe and t he (3 x 3)-Kr ordered structures on the hexagonally close-packed Ru(00 1) surface have been performed by conventional dynamic and tensor LEED calculations. The most important finding is that both rare gases tend to adsorb on or close to top sites. In the submonolayer structure of xenon, all atoms adsorb on well-defined top sites with unexpectedly sh ort bonding distance. For the close-packed Kr structure, the majority of the atoms are found to sit close to top sites, with these atoms hav ing the smallest distances from the substrate atoms; only the atoms lo cking into the substrate corrugation are found to occupy three-fold ho llow sites. The formation of an island structure of two different doma ins in which the superstructure locks into fcc and hcp sites with equa l probability is found. The mean layer distances between adsorbate and first Ru layer were found to be 3.54 +/- 0.06 Angstrom for xenon and 3.70 +/- 0.03 Angstrom for krypton. The distance between the first two Ru layers, d(12), is compressed beyond that of the clean surface, to 2.07 +/- 0.03 Angstrom (Xe) and 2.05 +/- 0.03 Angstrom (Kr). We descri be special problems occurring in the structural analysis of this type of system (radiation sensitivity, number of angular momenta included i n the description of electron scattering, importance of early adjustme nt of adsorbate Debye temperature due to very soft lateral vibrations) , and discuss the results in context with the question of the bonding mechanism of the heavy rare gases on transition metal surfaces. (C) 19 98 Elsevier Science B.V. All rights reserved.