Zh. Wang et al., PROBABILISTIC FAULT-DETECTION AND THE SELECTION OF MEASUREMENTS FOR ANALOG INTEGRATED-CIRCUITS, IEEE transactions on computer-aided design of integrated circuits and systems, 17(9), 1998, pp. 862-872
New methods for analog fault detection and for the selection of measur
ements for analog testing (wafer probe or final testing) are presented
, Using Bayes' rule, the information contained in the measurement data
and the information of the a priori probabilities of a circuit's bein
g fault free or faulty are converted into a posteriori probabilities a
nd used for fault detection in analog integrated circuits, with a deci
sion Criterion that considers the statistical tolerances and mismatche
s of the circuit parameters. An adaptive formulation of the a priori p
robabilities is given that updates their values according to the resul
ts of the testing and fault detection, In addition, a systematic metho
d is,proposed for the optimal selection of the measurement components
so as to minimize the probability of an erroneous test decision. Examp
les of DC wafer-probe testing as well as production testing using the
power-supply current spectrum are given that demonstrate the effective
ness of the algorithms.