SURFACE CORE-LEVEL SHIFTS IN CAF2-ON-SI(111) FILMS - EXPERIMENT AND THEORY

Authors
ROTENBERG E DENLINGER JD HESSINGER U LESKOVAR M OLMSTEAD MA
Citation
E. Rotenberg et al., SURFACE CORE-LEVEL SHIFTS IN CAF2-ON-SI(111) FILMS - EXPERIMENT AND THEORY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1444-1448
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena → ACNP
ISSN journal
10711023
Volume
11
Issue
4
Year of publication
1993
Pages
1444 - 1448
Database
ISI
SICI code
1071-1023(1993)11:4<1444:SCSICF>2.0.ZU;2-1
Abstract
Using a combination of in situ x-ray photoelectron spectroscopy and x- ray photoelectron diffraction, we have resolved surface core-level shi fts for Ca and F atoms in thin (three-eight layers) CaF2-on-Si(111) fi lms. These values are 0.7 +/- 0.1 eV towards higher binding energy for Ca 2p electrons and 0.6 +/- 0.1 eV towards lower kinetic energy for F KVV electrons. These shifts are in good agreement with a simple extra -atomic electrostatic model in which the shifts are due to the change in both the Madelung potential and the polarization response (relaxati on) at the surface. We find no evidence for altered ionicity at the Ca F2(111) surface.