Sj. Xia et Vi. Birss, HYDROUS OXIDE FILM GROWTH ON PT - I - TYPE-I BETA-OXIDE FORMATION IN 0.1 M H2SO4, Electrochimica acta, 44(2-3), 1998, pp. 467-482
The objective of this work has been to establish the compositional pro
perties of hydrous oxide films formed at polycrystalline Pt electrodes
in 0.1 mol/l sulfuric acid by multicycling to moderately positive pot
entials, i.e., less than 1.8 V vs. RHE. Under these conditions, both a
compact (alpha) and an overlaying hydrous (beta) oxide film (''Type I
'') form. Both QCMB and ellipsometric methods have been used, along wi
th electrochemical techniques, to characterize the alpha-oxide and the
Type I beta-oxide film. It has been shown that the alpha-oxide films
are non-hydrated under all conditions, being either PtO or PtO2. Very
thin beta-oxide films formed in the first cn. 30 s of growth are sugge
sted to be Pt(OH)(4). As the beta-oxide film thickens with time of gro
wth, it becomes increasingly hydrated, particularly towards its outer
surface, with a mass consistent with Pt(OH)(4). H2O and later with Pt(
OH)(4). 2H(2)O. The increasing water content of the film with thicknes
s can also be viewed as reflecting an increasing extent of film porosi
ty in the outer regions of the film. (C) 1998 Elsevier Science Ltd. Al
l rights reserved.