The cyclodextrins are known to present solubility properties which str
ongly depend on the symmetry of their macrocycle. In the present paper
, we investigate by X-ray reflectivity monolayers of amphiphilic alpha
-, beta-, and gamma-cyclodextrins deposited on silicon wafers. We show
the relationships between the in-plane packing of the three kinds of
cyclodextrin molecules and the measured structural parameters such as
the interfacial roughnesses, densities, and thicknesses.