LIFETIME OF NEGATIVE-ION RESONANCES AND THE DENSITY OF FREE-ELECTRON STATES - O-2 ISOLATED IN AN ARGON MATRIX

Citation
M. Michaud et al., LIFETIME OF NEGATIVE-ION RESONANCES AND THE DENSITY OF FREE-ELECTRON STATES - O-2 ISOLATED IN AN ARGON MATRIX, Physical review letters, 81(13), 1998, pp. 2807-2810
Citations number
34
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
81
Issue
13
Year of publication
1998
Pages
2807 - 2810
Database
ISI
SICI code
0031-9007(1998)81:13<2807:LONRAT>2.0.ZU;2-J
Abstract
The lifetime of a negative ion resonance in the condensed phase and it s impact on deposition of energy are investigated as a function of the resonance energy. The variation in the energy deposited, which can be measured in situ as an energy modulation of the vibrational scattered intensities, is shown to correlate with the inverse of the density of free electron states in the host medium. As an experimental model, we studied O-2 embedded in an Ar matrix.