PATTERNING OF POLY(3-ALKYLTHIOPHENE) THIN-FILMS BY DIRECT-WRITE ULTRAVIOLET-LASER LITHOGRAPHY

Citation
Tks. Wong et al., PATTERNING OF POLY(3-ALKYLTHIOPHENE) THIN-FILMS BY DIRECT-WRITE ULTRAVIOLET-LASER LITHOGRAPHY, Materials science & engineering. B, Solid-state materials for advanced technology, 55(1-2), 1998, pp. 71-78
Citations number
25
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
09215107
Volume
55
Issue
1-2
Year of publication
1998
Pages
71 - 78
Database
ISI
SICI code
0921-5107(1998)55:1-2<71:POPTBD>2.0.ZU;2-W
Abstract
Thin films of poly(3-methylthiophene) (P3MT), poly(3-butylthiophene) ( P3BT) and poly(3-hexylthiophene) (P3HT) have been patterned into micro structures using the 325 nm radiation from a helium-cadmium laser. At sufficiently high energy fluences, spontaneous mass removal occurred i n all three polymers to give groove structures about 3 mu m wide. At l ower incident fluences, both P3BT and P3HT underwent crosslinking as a result of I:he irradiation. Using chloroform as a developer, 1-6 mu m wide line structures were obtained on glass substrates. For the lowes t fluences, the P3BT linewidths after development were narrower than t he nominal beam diameter. The present results are potentially useful t o the fabrication of polymer electronic devices and microlithography. (C) 1998 Elsevier Science S.A. All rights reserved.