We report a study of speckles produced by x rays of partial transverse
coherence scattered from the surface of an optical reflection grating
. This study reveals the presence of surface inhomogeneity that is und
etectable with either laser (visible) light or transversely incoherent
x rays. Qualitative analysis of the speckle patterns provides us with
information on the surface morphology of the optical grating. The und
erlying order due to the periodicity of the grating enhances the detec
tion of the x-ray speckles. The speckle patterns are obtained using a
well-characterized partially transverse-coherent source (a secondary s
ource) produced with an arrangement of slits and a focusing mirror in
a synchrotron x-ray beamline. The degree of transverse coherence is me
asured and compared quantitatively with statistical optics predictions
for the complex-coherence factor. [S0163-1829(98)08835-3].