MONITORING, DIAGNOSIS AND CONTROL OF INDUSTRIAL-PROCESSES

Citation
Sm. Alexander et Tb. Gor, MONITORING, DIAGNOSIS AND CONTROL OF INDUSTRIAL-PROCESSES, Computers & industrial engineering, 35(1-2), 1998, pp. 193-196
Citations number
3
Categorie Soggetti
Computer Science Interdisciplinary Applications","Computer Science Interdisciplinary Applications","Engineering, Industrial
ISSN journal
03608352
Volume
35
Issue
1-2
Year of publication
1998
Pages
193 - 196
Database
ISI
SICI code
0360-8352(1998)35:1-2<193:MDACOI>2.0.ZU;2-B
Abstract
We present a framework for monitoring, diagnosis, and control of indus trial processes. This framework utilizes the multiresolution analysis capability of wavelet theory. Wavelet coefficient patterns at differen t scales, under a variety of process conditions, are noted to form pro cess fingerprints, these fingerprints yield process fault diagnosis. T his knowledge facilitates efficient control. (C) 1998 Elsevier Science Ltd. All rights reserved.