ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY OF HYDROGEN-INDUCED DEGRADATION IN FERROELECTRIC PB(ZR, TI)O-3 ON A PT ELECTRODE

Authors
Citation
N. Ikarashi, ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY OF HYDROGEN-INDUCED DEGRADATION IN FERROELECTRIC PB(ZR, TI)O-3 ON A PT ELECTRODE, Applied physics letters, 73(14), 1998, pp. 1955-1957
Citations number
6
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
73
Issue
14
Year of publication
1998
Pages
1955 - 1957
Database
ISI
SICI code
0003-6951(1998)73:14<1955:ATEOHD>2.0.ZU;2-C
Abstract
Changes in the crystal structure of Pb(Zr, Ti)O-3 (PZT) on a Pt electr ode caused by annealing in hydrogen-containing ambient have been studi ed using analytical transmission electron microscopy. A decrease in Pb composition and distortion in Ti-O coordination occur at the PZT/Pt i nterface. These findings indicate that preferential reduction of Pb an d sequential diffusion of Pb from the PZT to the Pt electrode play an important role in the changes of the PZT crystal. Thus, changes in cry stal structure due to annealing in a hydrogen-containing ambient can b e avoided by using electrode materials that prevent Pb diffusion. (C) 1998 American Institute of Physics. [S0003-6951(98)02340-7].