Ka. Thomas et al., INFLUENCE OF STRAIN AND MICROSTRUCTURE ON MAGNETOTRANSPORT IN LA0.7CA0.3MNO3 THIN-FILMS, Journal of applied physics, 84(7), 1998, pp. 3939-3948
A La0.7Ca0.3MnO3 thin film made by pulsed laser deposition (PLD) and a
nother film of the same composition made by metal organic chemical vap
or deposition (MOCVD), both on single crystal LaAlO3, were subject to
a series of six, short, controlled anneals. The oxygen content was pur
posely not changed in the films from the first anneal to subsequent an
neals. After each anneal, the film microstructures were characterized
to determine average grain size, lattice constants, nonuniform strain,
and crystalline mosaic spread, and these parameters were correlated w
ith the magnetotransport properties. For both sets of films, the influ
ence of annealing was to both increase the temperature at which the ma
ximum in the magnetoresistance occurs (T-m) and the maximum magnetores
istance (MR) value. The improvement in film properties occurred in con
junction with stress relaxation and improved crystallinity, as a resul
t of grain growth. The MOCVD films showed poorer grain coupling and po
orer epitaxy compared to the PLD films. These features did not signifi
cantly influence the absolute values of the resistivity, but did produ
ce spin canting in the MOCVD film, as seen in magnetization and resist
ivity versus field data. The canting resulted in a lower T-m and depre
ssed MR value for the MOCVD film which increased only marginally with
annealing. The work highlights the importance of controlling microstru
cture for optimizing properties of colossal magnetoresistance films. (
C) 1998 American Institute of Physics. [S0021-8979(98)05818-6].