GROWTH-PROPERTIES OF EDEN MODEL WITH ACCELERATION SITES

One plus one dimensional growth of an Eden model with acceleration sit es is investigated by simulations, where the acceleration sites which are distributed at random before the process starts become immediately Eden cells if the surface of Eden cluster touches them. The critical concentration of acceleration sites where the growth rate of the avera ge cluster height diverges is found as p(c) =0.592 +/- 0.005 correspon ding to the site percolation threshold of the square lattice. The expo nent which characterizes this divergence near the percolation threshol d have been found as nu =1.33 +/- 0.08. An effective roughness exponen t cc which characterizes the surface morphology is found to belong to the same universality class as the Eden model for p < p(c). At the cri tical concentration, the present system changes to hold a self-similar surface. (C) 1998 Elsevier Science B.V. All rights reserved.