MULTIPLE SOLUTIONS IN DATA FITTING - A TRAP IN EXAFS STRUCTURAL-ANALYSIS AND SOME IDEAS TO AVOID IT

Authors
MICHALOWICZ A VLAIC G
Citation
A. Michalowicz et G. Vlaic, MULTIPLE SOLUTIONS IN DATA FITTING - A TRAP IN EXAFS STRUCTURAL-ANALYSIS AND SOME IDEAS TO AVOID IT, Journal of synchrotron radiation, 5, 1998, pp. 1317-1320
Citations number
14
Categorie Soggetti
Instument & Instrumentation","Physics, Applied",Optics
Journal title
Journal of synchrotron radiation → ACNP
ISSN journal
09090495
Volume
5
Year of publication
1998
Part
5
Pages
1317 - 1320
Database
ISI
SICI code
0909-0495(1998)5:<1317:MSIDF->2.0.ZU;2-R
Abstract
A possible source of error on interatomic distance determination in EX AFS multishell data analysis is described on the basis of fitting a si mulated signal for a cluster of Rh atoms with an interaction of O atom s; a fit of an experimental signal is also presented. The origin of th is type of mistake is briefly discussed.