SIMPLE TECHNIQUE FOR MEASUREMENT OF ENERGY-SPECTRA OF IONS FROM LASER-PRODUCED PLASMA

Old absorption technique is revived for measuring the energy spectra o f ions arising from laser generated plasma. The technique suggested re lies on implantation of produced ions into a light element target situ ated close to the ion production site. Then the ion energy spectra are reconstructed from the depth profile of the implanted ions measured b y some of the common depth profiling techniques such as RES or SIMS. T heoretical range vs, ion energy relations are used for this purpose. I n this study the principles of the method are explained and its capabi lities are assessed. The feasibility of the method is demonstrated on the energy spectra of Ta ions arising from the laser generated plasma.