Atomic structures of the two-dimensional Ag layer grown on Si(001)-(2
x 1) at room temperature have been studied by coaxial impact collision
ion scattering spectroscopy. After several monolayers of Ag had been
deposited on the Si(001)-(2 x 1) surface, the two-dimensional Ag layer
was found to consist of Ag dimers. The bond length of the Ag dimer wa
s 2.89+/-0.05 Angstrom. The heights of the Ag dimers from the second S
i layer were 2.45 and 3.02 Angstrom. The Ag dimers were located in the
hollow sites between two dimers along the Si row, and in the middle o
f four neighbouring Si dimers with the orientation of the Ag dimer row
being perpendicular to that of the Si dimer. Thus, the Si substrate u
nder the two-dimensional Ag layer still retained its initial dimer str
ucture. Therefore, it was concluded that the two-dimensional Ag layer
on Si(001)-(2 x 1) had a Ag(2 x 2) structure with a saturation coverag
e of 1 ML. (C) 1998 Elsevier Science B.V. All rights reserved.