STRUCTURES AND DEFECTS IN LANGMUIR-BLODGETT-FILMS

The specular X-ray reflectivity profiles of a series of four transitio n metal-substituted tricosenoate Langmuir-Blodgett (LB) films have bee n successfully analysed using a model based on structural defects in L B films, which involves the coexistence of volume fractions with norma l and phase-shifted layer structures. This model is consistent with th e high degree of structural order normal to the surface of the films, as shown by the form of the specular reflectivity profiles (R(q(z)) ve rsus q(z)) and the presence of self-affine rough interfaces between th e layers which is demonstrated by the Lorentzian line shape of the off -specular profiles and the dependence of their half width on q(z)(2). (C) 1998 Published by Elsevier Science S.A. All rights reserved.