AN XPS AND SCANNING POLARIZATION FORCE MICROSCOPY STUDY OF THE EXCHANGE AND MOBILITY OF SURFACE IONS ON MICA

Authors
XU L SALMERON M
Citation
L. Xu et M. Salmeron, AN XPS AND SCANNING POLARIZATION FORCE MICROSCOPY STUDY OF THE EXCHANGE AND MOBILITY OF SURFACE IONS ON MICA, Langmuir, 14(20), 1998, pp. 5841-5844
Citations number
6
Categorie Soggetti
Chemistry Physical
Journal title
Langmuir → ACNP
ISSN journal
07437463
Volume
14
Issue
20
Year of publication
1998
Pages
5841 - 5844
Database
ISI
SICI code
0743-7463(1998)14:20<5841:AXASPF>2.0.ZU;2-B
Abstract
Potassium mica was treated with different ionic solutions to replace t he naturally occurring K+ on the surface by Ca2+, Mg2+, and H+ ions. T he extent of the exchange was monitored by variable emergence angle X- ray photoelectron spectroscopy (XPS). Scanning polarization force micr oscopy (SPFM) was used to measure the mobility of the surface ions as a result of water adsorption when the mica is exposed to different hum idity levels.