MICROSTRUCTURE OF THE INFINITE-LAYER STRUCTURAL SR1-XCUO2-DELTA THIN-FILMS

Authors
SUGII N ICHIKAWA M HAYASHI K KUBO K YAMAMOTO K YAMAUCHI H
Citation
N. Sugii et al., MICROSTRUCTURE OF THE INFINITE-LAYER STRUCTURAL SR1-XCUO2-DELTA THIN-FILMS, Physica. C, Superconductivity, 213(3-4), 1993, pp. 345-352
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
Physica. C, Superconductivity → ACNP
ISSN journal
09214534
Volume
213
Issue
3-4
Year of publication
1993
Pages
345 - 352
Database
ISI
SICI code
0921-4534(1993)213:3-4<345:MOTISS>2.0.ZU;2-O
Abstract
The microstructure of Sr1-xCuO2-delta thin films with x=0.00 and 0.10 was investigated by X-ray diffraction and transmission electron micros copy. Both films were single phase of the ''infinite-layer'' structure . However, in both films certain defects were observed, being extended along the ac-plane. The defect was found to be intergrown Sr2CuO3 cry stallites between the infinite-layer structure Sr1-xCuO2-delta crystal s. It was suspected that one of the reasons why superconductivity was not observed in these films was that Sr-deficient ab-planes were not o bserved in these film samples.