ADVANCES IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

High-resolution transmission electron microscopy (HRTEM) has developed to a state capable of providing structural information on an atomic s cale. Recent advances in instrumentation as well as in new strategies of imaging and information retrieval have extended the resolution towa rds the 0.1 nm level. Development of schemes for digital image analysi s have made HRTEM to a quantitative technique which allows to determin e the atomic structure of materials with sub-Angstrom accuracy. HRTEM is widely applied in many scientific fields to explore the static atom ic configurations of defects and small particles. Moreover, in-situ st udies of dynamic processes have become feasible on an atomic scale.