RECENT DEVELOPMENT IN QUANTITATIVE ELECTRON-DIFFRACTION FOR CRYSTALLOGRAPHY OF MATERIALS

The present paper gives an extended review on applications of electron diffraction techniques to practical problems in materials science, su ch as (1) determination of structure factors and temperature factors b y the critical voltage and intersecting Kikuchi line (IKL) methods, (2 ) measurement of local lattice parameters by convergent beam electron diffraction (CBED), (3) determination of partial degree of order in te rnary alloys by IKL-ALCHEMI method, and (4) determination of structure factors by energy filtering CBED. The emphasis is placed on recent ac hievements of electron diffraction as a tool of quantitative crystallo graphy of materials.