T. Schatz et al., CHARGE-CARRIER TRANSFER ACROSS THE SILICA NANOPARTICLE WATER INTERFACE/, JOURNAL OF PHYSICAL CHEMISTRY B, 102(37), 1998, pp. 7225-7230
We determined the yield of hydrated electrons, e(aq)(-), in irradiated
silica suspensions at very high particle concentrations. The initial
concentration of e(aq)(-), measured immediately after a pulse of high-
energy electrons, increases with the silica loading, proportionately w
ith the dose absorbed by the sample. Therefore, the yield of e(aq)(-),
per unit energy absorbed remains unaltered even at 50% weight of sili
ca. This observation holds for particles in the range of 7-22 nm in di
ameter. Under heavy loading of silica, a significant percentage of the
energy is absorbed by the silica (essentially equal to the silica wei
ght percent). Thus, our observations imply that energy that is origina
lly deposited in silica crosses the solid-liquid interface and appears
in the aqueous phase as solvated electrons. Possible mechanisms for t
his crossover process are discussed. It is proposed that either every
electron that is generated in silica escapes to the water or that high
ly energetic secondary electrons are ejected from the silica particles
and subsequently create spurs similar to those formed by primary elec
trons that initially are deposited in water.