TIME-RESOLVED HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY USING A PIEZO-DRIVING SPECIMEN HOLDER FOR ATOMIC-SCALE MECHANICAL INTERACTION

Authors
KIZUKA T TANAKA N DEGUCHI S NARUSE M
Citation
T. Kizuka et al., TIME-RESOLVED HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY USING A PIEZO-DRIVING SPECIMEN HOLDER FOR ATOMIC-SCALE MECHANICAL INTERACTION, MICROSCOPY AND MICROANALYSIS, 4(3), 1998, pp. 218-225
Citations number
29
Categorie Soggetti
Microscopy
Journal title
MICROSCOPY AND MICROANALYSIS → ACNP
ISSN journal
14319276
Volume
4
Issue
3
Year of publication
1998
Pages
218 - 225
Database
ISI
SICI code
1431-9276(1998)4:3<218:THTEUA>2.0.ZU;2-S
Abstract
Time-resolved high-resolution transmission electron microscopy at a sp atial resolution of 0.2 nm and a time resolution of 1/60 sec using a p iezo-driving specimen holder is reported here. Various types of atomic processes in mechanical interaction, such as contact, bonding, deform ation, and fracture, in nanometer-sized gold crystallites and carbon n anotubes are demonstrated.