TECHNIQUES FOR STUDYING NANOPARTICLE SINTERING BY PLAN-VIEW IN-SITU TRANSMISSION ELECTRON-MICROSCOPY

Authors
YEADON M YANG JC AVERBACK RS GIBSON JM
Citation
M. Yeadon et al., TECHNIQUES FOR STUDYING NANOPARTICLE SINTERING BY PLAN-VIEW IN-SITU TRANSMISSION ELECTRON-MICROSCOPY, MICROSCOPY AND MICROANALYSIS, 4(3), 1998, pp. 248-253
Citations number
10
Categorie Soggetti
Microscopy
Journal title
MICROSCOPY AND MICROANALYSIS → ACNP
ISSN journal
14319276
Volume
4
Issue
3
Year of publication
1998
Pages
248 - 253
Database
ISI
SICI code
1431-9276(1998)4:3<248:TFSNSB>2.0.ZU;2-Z
Abstract
We discuss various techniques for the characterization of supported na noparticles by in situ plan-view transmission electron microscopy. In particular, we discuss here mechanisms of image contrast formation by particles undergoing reorientation on the surface of a single crystal substrate. We consider reorientation by a variety of mechanisms includ ing rotation, sintering and grain growth, and surface diffusion. Exper imental observations are presented and the data compared with theoreti cal predictions.