FDTD CHARACTERIZATION OF WAVE-GUIDE-PROBE STRUCTURES

Authors
TENTZERIS E KRUMPHOLZ M DIB NH YOOK JG KATEHI PB
Citation
E. Tentzeris et al., FDTD CHARACTERIZATION OF WAVE-GUIDE-PROBE STRUCTURES, IEEE transactions on microwave theory and techniques, 46(10), 1998, pp. 1452-1460
Citations number
21
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
IEEE transactions on microwave theory and techniques → ACNP
ISSN journal
00189480
Volume
46
Issue
10
Year of publication
1998
Part
1
Pages
1452 - 1460
Database
ISI
SICI code
0018-9480(1998)46:10<1452:FCOWS>2.0.ZU;2-F
Abstract
The finite-difference time-domain (FDTD) technique is applied in the c alculation of the S-parameters of diode mounting and waveguide-probe s tructures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is in vestigated. A waveguide absorber based on analytic Green's functions i s used to minimize the reflections over a wide band of frequencies.