H. Krishnamoorty et Hv. Tippur, EVALUATION OF ELASTOPLASTIC INTERFACIAL FRACTURE PARAMETERS IN SOLDER-COPPER BIMATERIAL USING MOIRE INTERFEROMETRY, Journal of electronic packaging, 120(3), 1998, pp. 267-274
An experimental investigation dealing with failure characterization of
63/37 solder-copper interfaces is presented. The method of moire inte
rferometry is used for mapping elasto;plastic deformations in bimateri
als subjected to predominantly tensile loading. A method for quantifyi
ng the fracture parameter-the J-integral-using full-field measurement
of crack opening displacements has been developed. A linear relationsh
ip between crack tip opening displacements (CTOD) and the J-integral i
s demonstrated. The crack growth resistance curve and hence crack init
iation toughness J(c) value for the bimaterial is obtained. Full-field
optical information has also suggested the possibility of using a sim
pler method for the J-integral estimation using a single strain gage f
or fracture testing of interfaces with large mismatch in this geometry
.