THE USE OF SUPERLATTICE REFLECTIONS FOR WEAK-BEAM MICROSCOPY

Authors
NGAN AHW JONES IP
Citation
Ahw. Ngan et Ip. Jones, THE USE OF SUPERLATTICE REFLECTIONS FOR WEAK-BEAM MICROSCOPY, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 68(3), 1993, pp. 525-535
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties → ACNP
ISSN journal
01418610
Volume
68
Issue
3
Year of publication
1993
Pages
525 - 535
Database
ISI
SICI code
0141-8610(1993)68:3<525:TUOSRF>2.0.ZU;2-2
Abstract
The use of superlattice reflections from ordered compounds for weak be am imaging is rendered difficult by the weakness of the beams and by t he presence of nearby strong fundamental reflections. The conditions f or successful weak beam superlattice imaging are derived and applied t o some explicit examples.