IN-SITU CHARACTERIZATION OF SURFACES AT HIGH-TEMPERATURE BY USING SIMULTANEOUSLY A PYROREFLECTOMETER AND AN X-RAY DIFFRACTOMETER

Authors
LLAURO G HERNANDEZ D SIBIEUDE F GINESTE JM VERGES R ANTOINE D
Citation
G. Llauro et al., IN-SITU CHARACTERIZATION OF SURFACES AT HIGH-TEMPERATURE BY USING SIMULTANEOUSLY A PYROREFLECTOMETER AND AN X-RAY DIFFRACTOMETER, Applied surface science, 135(1-4), 1998, pp. 91-96
Citations number
5
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
135
Issue
1-4
Year of publication
1998
Pages
91 - 96
Database
ISI
SICI code
0169-4332(1998)135:1-4<91:ICOSAH>2.0.ZU;2-M
Abstract
An optical fiber pyroreflectometer was adapted to an X-ray diffraction (XRD) high temperature chamber, in order to analyse and control in si tu the thermoradiative properties and the temperature of the sample si multaneously examined by XRD. The modifications accompanying the high temperature oxidation of two different materials: TiO2-x plates and CV D (Ti, Si, N) coatings were chosen as illustrating examples. (C) 1998 Elsevier Science B.V. All rights reserved.