ATOMIC-FORCE MICROSCOPY OF GIBBSITE

Authors
LLOYD S THURGATE SM CORNELL RM PARKINSON GM
Citation
S. Lloyd et al., ATOMIC-FORCE MICROSCOPY OF GIBBSITE, Applied surface science, 135(1-4), 1998, pp. 178-182
Citations number
8
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
135
Issue
1-4
Year of publication
1998
Pages
178 - 182
Database
ISI
SICI code
0169-4332(1998)135:1-4<178:AMOG>2.0.ZU;2-Y
Abstract
Atomic force microscopy has been used to image the surface structure o f a range of gibbsite (AI(OH)(3)) crystals. A variety of microtopograp hies has been imaged on the (001) plane, and sub-nanometer detail has been observed on flat areas that is commensurate with the known bulk s tructure of the solid. (C) 1998 Elsevier Science B.V. All rights reser ved.