AMBIENT GAS DEPENDENCE OF HYDROGENATED SILICON CLUSTERS GROWN IN AN ION-TRAP

Citation
Mo. Watanabe et al., AMBIENT GAS DEPENDENCE OF HYDROGENATED SILICON CLUSTERS GROWN IN AN ION-TRAP, Journal of physics. D, Applied physics (Print), 31(18), 1998, pp. 63-66
Citations number
24
Categorie Soggetti
Physics, Applied
ISSN journal
00223727
Volume
31
Issue
18
Year of publication
1998
Pages
63 - 66
Database
ISI
SICI code
0022-3727(1998)31:18<63:AGDOHS>2.0.ZU;2-Z
Abstract
Hydrogenated Si cluster ions have been grown from silane gas under ele ctron irradiation in an ion trap with five different gases, H-2, He, N e, Ar and Xe, as ambient. The mass spectra of Si6Hx+ always had three peaks corresponding to x = 1, 7 and 13, but their peak heights varied depending on the ionization energy of the ambient gas except that Hp p roduced an exceptionally large amount of Si6Hx+. This dependence was a ttributed to the ability of the ambient gas to dissociate SiH4 to form SiH2 reactant, which is essential to the growth of Si6Hx+.