Mo. Watanabe et al., AMBIENT GAS DEPENDENCE OF HYDROGENATED SILICON CLUSTERS GROWN IN AN ION-TRAP, Journal of physics. D, Applied physics (Print), 31(18), 1998, pp. 63-66
Hydrogenated Si cluster ions have been grown from silane gas under ele
ctron irradiation in an ion trap with five different gases, H-2, He, N
e, Ar and Xe, as ambient. The mass spectra of Si6Hx+ always had three
peaks corresponding to x = 1, 7 and 13, but their peak heights varied
depending on the ionization energy of the ambient gas except that Hp p
roduced an exceptionally large amount of Si6Hx+. This dependence was a
ttributed to the ability of the ambient gas to dissociate SiH4 to form
SiH2 reactant, which is essential to the growth of Si6Hx+.