An investigation into the effect of carrier trapping in polymer Schott
ky diodes is presented. The diodes have been fabricated using regioreg
ular poly(3-octylthiophene) as the semiconductor and aluminium and ind
ium doped tin-oxide as the rectifying and ohmic contacts respectively.
The diodes show rectification ratios up to 3-4 orders of magnitude. E
vidence for image force lowering of the Schottky barrier is observed.
The frequency dependence of the capacitance, conductance and dielectri
c loss is analysed, from which detailed information on the metal/semic
onductor interface and the doping level is obtained. An equivalent cir
cuit is proposed.