Ferroelectric thin films of PbTiO3 and Pb(Zr0.5Ti0.5)O-3 were deposite
d using a sol-gel process from a highly stable precursor solution deri
ved from a unique and simple system consisting of basic lead acetate;
titanium and zirconium butoxides. This new system simplifies the chemi
cal processing of precursor solutions of lead titanate-based materials
. By adjusting the concentration of the precursor solution and using t
he dip-coating technique, homogeneous thin films of PbTiO3 and Pb(Zr0.
5Ti0.5)O-3 were deposited onto glass, conducting glass and single crys
tal MgO(100) and SrTiO3(100) substrates. The thin-films were character
ized by X-ray diffraction (XRD) and transmission electron microscopy (
TEM). P-E hysteresis of these films revealed their ferroelectric natur
e. The effect of indium-tin-oxide (ITO) bottom electrode on the micros
tructure of PZT thin films in the PZT/ITO/glass substrate structure is
also reported.