SURFACE-ROUGHNESS IN THIN-FILM GROWTH - THE EFFECT OF MASS-TRANSPORT BETWEEN LAYERS

Authors
ZHANG ZY DETCH J METIU H
Citation
Zy. Zhang et al., SURFACE-ROUGHNESS IN THIN-FILM GROWTH - THE EFFECT OF MASS-TRANSPORT BETWEEN LAYERS, Physical review. B, Condensed matter, 48(7), 1993, pp. 4972-4975
Citations number
33
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
48
Issue
7
Year of publication
1993
Pages
4972 - 4975
Database
ISI
SICI code
0163-1829(1993)48:7<4972:SITG-T>2.0.ZU;2-E
Abstract
We present one-dimensional simulations using kinetic parameters and de position conditions typical to epitaxy. We study how various microscop ic kinetic parameters influence surface morphology and test scaling pr edictions made by continuum theories.