Kl. Liu et al., CORRECTIONS OF SPECTRAL INTERFERENCES BY A SEQUENTIAL INDUCTIVELY-COUPLED PLASMA SPECTROMETER WITH AN INTELLIGENT WAVELENGTH CALIBRATING DEVICE, Spectrochimica acta, Part B: Atomic spectroscopy, 53(10), 1998, pp. 1455-1461
The characteristics of a sequential inductively coupled plasma spectro
meter with an intelligent wavelength calibrating device (ICP-IWC) used
to correct spectral interferences were investigated and compared with
that of a, very old multi-channel inductively coupled plasma atomic e
mission spectrometry (ICP-AES). The computer intelligent wavelength-ca
librating program used in this sequential ICP-IWC spectrometer is disc
ussed. The analytical results of eight elemental components of a basic
slag standard after spectral interference correction using this instr
ument are in good agreement with the certified values and those by the
line-profile method. The system does not require 8-10 h pre-heating a
s needed with a local thermostat or profiles for every analytical line
as in the line-profile method, which indicates that the sequential IC
P-IWC spectrometer can avoid and correct the spectral interferences ef
fectively by choosing the analytical lines properly and finding the pe
aks of the analytical lines precisely. The flexibility of choosing spe
ctral lines is a common merit of all kinds of modern sequential ICPs,
but the high accuracy of finding out the peaks of spectral lines witho
ut the need of a local thermostat or the line-profile method is the un
ique merit of the sequential ICP-IWC. It has been proven possible to u
se the intelligent wavelength calibrating device in the sequential ICP
spectrometer instead of a traditional local thermostat or the line-pr
ofile method. The instrument has proven to be quite effective, with th
e features of time-saving, safety, simple structure as well as the pro
spects of widespread applications. (C) 1998 Elsevier Science B.V. All
rights reserved.