Electronic channel fringe holography for depth and delay measurements

Authors
Iglesias, I Chen, HS Mills, KD Dilworth, DS Leith, EN
Citation
I. Iglesias et al., Electronic channel fringe holography for depth and delay measurements, APPL OPTICS, 38(11), 1999, pp. 2196-2203
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
38
Issue
11
Year of publication
1999
Pages
2196 - 2203
Database
ISI
SICI code
0003-6935(19990410)38:11<2196:ECFHFD>2.0.ZU;2-1
Abstract
Electronic spectral holography in the form developed by Shih [Ph.D. dissert ation, University Microfilms, Ann Arbor, Mich. (1995)] is adapted to variou s applications, including optical coherence tomography in scattering media, contouring of surfaces, and optical fiber mode examination. (C) 1999 Optic al Society of America.