Measurement of changes in optical path length and reflectivity with phase-shifting laser feedback interferometry

Citation
B. Ovryn et Jh. Andrews, Measurement of changes in optical path length and reflectivity with phase-shifting laser feedback interferometry, APPL OPTICS, 38(10), 1999, pp. 1959-1967
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
38
Issue
10
Year of publication
1999
Pages
1959 - 1967
Database
ISI
SICI code
0003-6935(19990401)38:10<1959:MOCIOP>2.0.ZU;2-S
Abstract
The operating characteristics of a novel phase-shifting interferometer are presented. Interference arises by reflecting the light from a sample back i nto the cavity of a cw He-Ne laser. Changes in phase and fringe visibility are calculated from an overdetermined set of phase-shifted intensity measur ements with the phase shifts being introduced with an electro-optic modulat or. The interferometer is sensitive enough to measure displacements below 1 Hz with a rms error of approximately 1 nm from a sample that reflects only 3% of the 28 mu W that is incident on its surface. The interferometer is a pplied to the determination of cantilever bending of a piezoelectric bimorp h. (C) 1999 Optical Society of America.