Measurement of shape by using projected random patterns and temporal digital speckle photography

Citation
M. Sjodahl et P. Synnergren, Measurement of shape by using projected random patterns and temporal digital speckle photography, APPL OPTICS, 38(10), 1999, pp. 1990-1997
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
38
Issue
10
Year of publication
1999
Pages
1990 - 1997
Database
ISI
SICI code
0003-6935(19990401)38:10<1990:MOSBUP>2.0.ZU;2-O
Abstract
Projected random patterns have been used to measure the shape of discontinu ous objects. A sequence of independent random patterns are projected onto t he object. These images are analyzed by use of the technique called tempora l digital speckle photography (DSP) that is introduced here. With temporal DSP the spatial resolution of the shape measurement is improved considerabl y compared with previously reported results with projected random patterns. A calibration procedure is described that uses a sequence of independent r andom patterns to calibrate measurement volume. As a result, independent sp ace coordinates for each subimage are obtained. The accuracy is of the orde r of 1/1000 of the field of view where a subimage size of 8 pixels seems to be a good compromise between reliability and spatial resolution. The techn ique is illustrated with a measurement of an electrical plug and a 9-V batt ery. (C) 1999 Optical Society of America.