Simple expressions for transmission and reflection matrix elements of a biaxial thin layer at normal incidence

The extended Jones matrix method is applied for determination of the transm ission and reflection matrices for a normally incident plane wave upon an h omogeneous and lossless biaxial thin layer. The elements of these matrices are expressed by simple analytical relations. By using these relations one can express analytically the polarization-dependent optical parameters to b e determined by generalized ellipsometry. (C) 1999 Optical Society of Ameri ca.