First-principles study of beta-AlN thin films on beta-SiC(001)

Citation
R. Di Felice et al., First-principles study of beta-AlN thin films on beta-SiC(001), APPL PHYS L, 74(15), 1999, pp. 2137-2139
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
15
Year of publication
1999
Pages
2137 - 2139
Database
ISI
SICI code
0003-6951(19990412)74:15<2137:FSOBTF>2.0.ZU;2-4
Abstract
We have investigated the initial stages of formation of cubic AlN films on SiC(001) by studying the energetics of possible structures. We have conside red 1X1 and p(4X1) surface reconstructions for the films, and we have allow ed for different interface arrangements including atomic mixing. The result s of our first-principles calculations reveal that, in N-rich conditions, n o two-dimensional film structure is stable. However, in Al-rich conditions, it is possible to stabilize a thick wetting layer of cubic AlN provided th e proper interface mixing is achieved. The most stable AlN film exhibits a p(4X1) surface reconstruction. (C) 1999 American Institute of Physics. [S00 03-6951(99)03915-7].