Size selected silicon clusters have been isolated in rare gas matrices
and studied by optical absorption spectroscopy. The clusters were pro
duced in a pulsed laser vaporization source, size selected with a quad
rupole mass spectrometer and deposited at low energies into a co-conde
nsed krypton matrix held at T<20 K. A comparison of the optical spectr
a of ten atom wide bands (Si-25-Si35, Si35-Si45 and Si45-Si55) shows t
he general size evolution of the optical properties. Single cluster si
zes have also been isolated and show somewhat sharper spectra than the
bands. The measured spectra show similarities to spectra calculated u
sing Mie theory and bulk optical constants. Cluster-cluster agglomerat
ion was studied by evaporating the inert gas matrix. The results sugge
st that the clusters agglomerate into larger particles even under the
mildest ''soft landing'' conditions.