Experimental analysis of transient current testing based on charge observation

Citation
J. Segura et al., Experimental analysis of transient current testing based on charge observation, ELECTR LETT, 35(6), 1999, pp. 441-443
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
35
Issue
6
Year of publication
1999
Pages
441 - 443
Database
ISI
SICI code
0013-5194(19990318)35:6<441:EAOTCT>2.0.ZU;2-Q
Abstract
A rest technique that uses the charge driven into the circuit computed from the transient pou;er supply current is analysed. Experimental data are pro vided concerning the merits of this technique and its effectiveness at dete cting open defects that do not increase the power consumption (those that c annot be detected with I-DDQ).