C. Quoix et al., Time-resolved studies of short pulse laser-produced plasmas in silicon dioxide near breakdown threshold, EPJ-APPL PH, 5(2), 1999, pp. 163-169
Using the technique of frequency-domain interferometry, we demonstrate a ne
w way of studying: laser-induced breakdown at the surface of dielectric mat
erials. A theoretical model based on electron production by multiphoton ion
isation, inverse bremsstrahlung heating, and collisional ionisation is in q
uantitative agreement with both the detailed time variation of tilt: dielec
tric constant and the pulse width variation of the fluence threshold. From
the complex reflection coefficient measured with the two probe pulse polari
sations in quadrature, we deduce the time variation of the dielectric const
ant of silica during breakdown.