Improved quasi-static spectral domain analysis of microstrip lines on high-conductivity insulator-semiconductor substrates

Authors
Aguilera, J Marques, R Horno, M
Citation
J. Aguilera et al., Improved quasi-static spectral domain analysis of microstrip lines on high-conductivity insulator-semiconductor substrates, IEEE MICR G, 9(2), 1999, pp. 57-59
Citations number
5
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE MICROWAVE AND GUIDED WAVE LETTERS
ISSN journal
10518207 → ACNP
Volume
9
Issue
2
Year of publication
1999
Pages
57 - 59
Database
ISI
SICI code
1051-8207(199902)9:2<57:IQSDAO>2.0.ZU;2-J
Abstract
An improved quasi-static integral spectral domain analysis (SDA) for multis trips on a layered insulator-semiconductor substrate is proposed, This meth od of analysis significantly improves previous quasi-static SDA, accounting for the series resistance of the line in addition to the shunt conductance considered in the conventional quasi-TEM SDA, An excellent agreement with the full-wave analysis results is obtained with considerable less computati on time.