Dielectric breakdown in SiO2 - A survey of test methods

Authors
Wolters, DR Verwey, JF Zegers-Van Duijnhoven, ATA
Citation
Dr. Wolters et al., Dielectric breakdown in SiO2 - A survey of test methods, INSTABILITIES IN SILICON DEVICES, VOL 3, 1999, pp. 233-263
Categorie Soggetti
Current Book Contents
Journal title
INSTABILITIES IN SILICON DEVICES, VOL 3 → ACNP
Year of publication
1999
Pages
233 - 263
Database
ISI
SICI code