Hot carrier injections in SiO2 and related instabilities in submicrometer MOSFETs

Authors
Vuillaume, D
Citation
D. Vuillaume, Hot carrier injections in SiO2 and related instabilities in submicrometer MOSFETs, INSTABILITIES IN SILICON DEVICES, VOL 3, 1999, pp. 265-339
Categorie Soggetti
Current Book Contents
Journal title
INSTABILITIES IN SILICON DEVICES, VOL 3 → ACNP
Year of publication
1999
Pages
265 - 339
Database
ISI
SICI code