Electrical and optical properties of silicon, doped by erbium during sublimational molecular beam epitaxy

Citation
Ay. Andreev et al., Electrical and optical properties of silicon, doped by erbium during sublimational molecular beam epitaxy, IAN FIZ, 63(2), 1999, pp. 392-399
Citations number
21
Categorie Soggetti
Physics
Journal title
IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA
ISSN journal
03676765 → ACNP
Volume
63
Issue
2
Year of publication
1999
Pages
392 - 399
Database
ISI
SICI code
0367-6765(199902)63:2<392:EAOPOS>2.0.ZU;2-C