Development and applications of fringing electric field dielectrometry sensors and parameter estimation algorithms

Citation
Av. Mamishev et al., Development and applications of fringing electric field dielectrometry sensors and parameter estimation algorithms, J ELECTROST, 46(2-3), 1999, pp. 109-123
Citations number
26
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTROSTATICS
ISSN journal
03043886 → ACNP
Volume
46
Issue
2-3
Year of publication
1999
Pages
109 - 123
Database
ISI
SICI code
0304-3886(199904)46:2-3<109:DAAOFE>2.0.ZU;2-5
Abstract
Recent advances in the field of interdigital w - k (frequency-wavenumber) d ielectrometry are described. The paper offers an overview of several applic ations of this technology developed during the last few years. Interdigital w-k dielectrometry offers the ability to non-destructively measure from on e side dielectric permittivity, conductivity and related physical propertie s distributed spatially throughout the volume of dielectric materials. A se parate mapping may be required to translate the distribution of the complex dielectric permittivity into the distribution of other properties, which i nclude moisture concentration, impurity concentration, density, porosity, t hickness of films, structural integrity, surface coatings, etc. As represen tative examples of applications of this technology, the results of the meas urement of moisture diffusion into a 1.5 mm thick oil-free transformer pres sboard are presented, followed by an illustrative case of spectroscopy-base d landmine detection.