Characterization of Ge-Bi-S glass by thermal, electrical, switching and optical measurements

Citation
K. Sedeek et al., Characterization of Ge-Bi-S glass by thermal, electrical, switching and optical measurements, J MATER SCI, 33(18), 1998, pp. 4621-4626
Citations number
40
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
33
Issue
18
Year of publication
1998
Pages
4621 - 4626
Database
ISI
SICI code
0022-2461(19980915)33:18<4621:COGGBT>2.0.ZU;2-L
Abstract
A study of the synthesized Ge22.5Bi7S70.5 glassy system has been carried ou t. Differential thermal analysis data indicate the retention in the as-quen ched sample of two amorphous phases. Thermal conductivity, psi, measurement s on bulk sample reveal that the main contribution to psi is due to phonon thermal conductivity. Thermal evaporation of the synthesized ingot gives fi lms with Ge20.7Bi6.8S72.5 as composition. The values of the activation ener gy and the pre-exponential factor calculated from the direct current electr ical conductivity above 53 degrees C suggest that carrier conduction occurr ed between extended states in these films. The I-V characteristics in the o ff-state and the switching phenomenon are investigated. A memory switch wit h a threshold voltage decreasing with temperature is detected for the studi ed films. Optical parameters such as absorption coefficient, optical gap an d refractive index are also determined. Comparison with binary Ge-S glass r eveals that the addition of Bi introduces additional absorbing states at ba nd edges. (C) 1998 Kluwer Academic Publishers.