An STM and atomic force microscopy study of the effects of 1.8 MeV electron bombardment on the surface of graphite

Citation
Yj. Chen et al., An STM and atomic force microscopy study of the effects of 1.8 MeV electron bombardment on the surface of graphite, J MATER SCI, 33(18), 1998, pp. 4657-4663
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
33
Issue
18
Year of publication
1998
Pages
4657 - 4663
Database
ISI
SICI code
0022-2461(19980915)33:18<4657:ASAAFM>2.0.ZU;2-0
Abstract
Highly oriented pyrolitic graphite was irradiated with 1.8 MeV electrons at 45 degrees and nea r-grazing (86 degrees) angles of incidence. For doses u p to 10(16) cm(-2) electrons the surface of the samples subjected to 45 deg rees incidence, observed by both STM and atomic force microscopy (AFM) rema ined the same as the original sample showing only the usual periodic atomic corrugation, with an atomic spacing of 0.246 nm. For near-grazing incidenc e, at a dose of 5 x 10(12) cm(-2) electrons, features of nanometre size are observed, some elongated along the direction of the beam incidence. These are attributed to the effects of single electron-carbon interactions in the top surface layers. At a dose of 5 x 10(14) cm(-2) electrons (near grazing incidence) both STM and AFM observations show an anomalously large (period 2.5-17 nm) superperiodicity superimposed on the normal 0.246 nm atomic spa cing of graphite. This Moire-like pattern suggests that the corrugations ar e electronic as well as topographic in origin. We propose that near-grazing incidence electron irradiation causes break-up of the surface layers into fragments, largely retaining six-fold atomic rings, that rotate by a small angle resulting in the observed pattern due to interaction with deeper bulk -structure layers. (C) 1998 Kluwer Academic Publishers.