Yj. Chen et al., An STM and atomic force microscopy study of the effects of 1.8 MeV electron bombardment on the surface of graphite, J MATER SCI, 33(18), 1998, pp. 4657-4663
Highly oriented pyrolitic graphite was irradiated with 1.8 MeV electrons at
45 degrees and nea r-grazing (86 degrees) angles of incidence. For doses u
p to 10(16) cm(-2) electrons the surface of the samples subjected to 45 deg
rees incidence, observed by both STM and atomic force microscopy (AFM) rema
ined the same as the original sample showing only the usual periodic atomic
corrugation, with an atomic spacing of 0.246 nm. For near-grazing incidenc
e, at a dose of 5 x 10(12) cm(-2) electrons, features of nanometre size are
observed, some elongated along the direction of the beam incidence. These
are attributed to the effects of single electron-carbon interactions in the
top surface layers. At a dose of 5 x 10(14) cm(-2) electrons (near grazing
incidence) both STM and AFM observations show an anomalously large (period
2.5-17 nm) superperiodicity superimposed on the normal 0.246 nm atomic spa
cing of graphite. This Moire-like pattern suggests that the corrugations ar
e electronic as well as topographic in origin. We propose that near-grazing
incidence electron irradiation causes break-up of the surface layers into
fragments, largely retaining six-fold atomic rings, that rotate by a small
angle resulting in the observed pattern due to interaction with deeper bulk
-structure layers. (C) 1998 Kluwer Academic Publishers.