Coulomb breach effect emerging in shot noise

Citation
G. Iannaccone et al., Coulomb breach effect emerging in shot noise, NANOTECHNOL, 10(1), 1999, pp. 97-101
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
NANOTECHNOLOGY
ISSN journal
09574484 → ACNP
Volume
10
Issue
1
Year of publication
1999
Pages
97 - 101
Database
ISI
SICI code
0957-4484(199903)10:1<97:CBEEIS>2.0.ZU;2-0
Abstract
Noise can be a unique probe of electron-electron correlations in nanoscale electron devices. While stationary or small signal transport can often be s imply understood in terms of single particle behaviour, noise can be extrem ely sensitive to many-body effects (Landauer L 1996 Physica B 227 156). We present a new collective phenomenon emerging in electron transport in a resonant tunnelling diode, due to Coulomb repulsion dramatically magnified by the particular shape of the density of states in the quantum well. This phenomenon, for which the name of Coulomb breach is proposed, reveals itsel f by making shot noise several times greater than that expected in the abse nce of correlated electron motion. Experimental results showing shot noise enhancement of a factor 6.6 are reported.